Title: Electron Microprobe Analysis
Author: S.J.B. Reed
Publisher: Cambridge University Press; 2nd edition (January 28, 1993)
ISBN: 0521419565
Book Description (from Amazon): This book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix (ZAF) corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.
Statistically Improbable Phrases (from Amazon): normal electron incidence, pulse height depression, stopping power corrections, focussing geometry, continuum fluorescence, extendable dead time, spectrometer mechanism, focussing spectrometers, final lens aperture, critical excitation energy, light element analysis, silicon dead layer, evaporated multilayers, probe forming system, electron backscattering coefficient, calculating absorption corrections, uncorrected concentration, fluorescence corrections, shell ionization, incomplete charge collection, overvoltage ratio, mean excitation energy, refracting objective, depth distribution function, spectrometer efficiency
Most Common Terms (from Amazon): absorption analysis atomic background beam characteristic concentration constant continuum correction counter counts crystal current detector distribution electron elements energy equation experimental expression fluorescence image incident intensity keV layer lens lines microprobe noise order peak probe pulse radiation range ratio resolution sample source specimen spectrometer spectrum standard surface voltage wavelength window
Title: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Author: S.J.B. Reed
Publisher: Cambridge University Press; 2nd edition (July 31, 2005)
ISBN: 052184875X
Book Description (from Amazon): Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Statistically Improbable Phrases (from Amazon): electron microprobe instruments, dwell time per pixel, final lens aperture, critical excitation energy, uncorrected concentrations, electron optical column, shell ionization, light element analysis, incident electron energy, matrix corrections, pulse height analysis, mean atomic number, low accelerating voltage, electron lenses, backscattered electrons, compositional contrast, topographic contrast, frame scan, electron range, escape peak, absorption corrections, dispersive spectrometers, specimen chamber, specimen height, incident electrons
Most Common Terms (from Amazon): absorption accelerating analysis area atomic background beam BSE carbon coating concentrations corrections crystal current detector electron elements energy field image incident instruments intensity keV lens methods minerals peak point pulse quantitative range ratio resolution results sample scanning secondary section SEM source specimen spectra spectrometer spectrum standard surface system voltage wavelength
Title: Electron Microscopy and Analysis
Authors: Peter J. Goodhew, John Humphreys, Richard Beanland, F.J. Humphreys, R. Beanland
Publisher: Taylor & Francis Group; 3rd edition (December 1, 2000)
ISBN: 0748409688
From Book News: Three British professors introduce the principles behind both scanning and transmission electron microscopes, describing the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. The third edition adds outlines of confocal light microscopy and scanned probe microscopies.
Book Description (from Amazon): The new edition of this comprehensive introductory text has been extensively revised and updated. The text is liberally illustrated and now incorporates questions and answers with each chapter. Already an established laboratory manual, this edition will be essential reading for both the materials scientist and the bio-scientist.
Statistically Improbable Phrases (from Amazon): specimen pixel, interaction with the specimen, frame scan time, electron probe microanalyser, undeflected beam, electron coefficient, extinction contours, convergent beam diffraction, extinction distance, objective aperture, annular dark field, energy loss spectrometer, plasmon peak, backscattered electron detector, thickness fringes, crystalline specimen, diffraction contrast, crystal spectrometer, condenser aperture, projector lenses, atomic number contrast, inner shell excitation, convergence angle, backscattered electrons, kinematical theory
Most Common Terms (from Amazon): analysis angle aperture area atomic atoms backscattered beam conditions contrast crystal current depth detector diameter diffraction electron elements energy field image imaging intensity ion lattice lens magnification material microscope microscopy objective peak planes point probe region resolution sample scanning scattering secondary section SEM signal specimen spectrometer spot surface thickness wavelength
Title: Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
Authors: Ludwig Reimer, P.W. Hawkes (Editor)
Publisher: Springer; 2nd edition (October 16, 1998)
ISBN: 3540639764
Book Description (from Amazon): Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Statistically Improbable Phrases (from Amazon): total backscattering coefficient, electron channelling patterns, exit momenta, biased collector grid, electron diffusion cloud, electron probe diameter, channelling contrast, specimen current mode, electron probe size, pole piece plate, backscatter correction factor, electron mirror microscopy, electron backscattering patterns, incident electron probe, electron probe currents, electron beam blanking, negatively biased grid, probe forming lens, pole piece gap, panorama diagram, diffusely scattered electrons, gun brightness, overvoltage ratio, shadowing contrast, small electron probe
Most Common Terms (from Amazon): absorption angle area backscattered backscattering beam BSE contrast crystal current depth detector diameter diffraction diffusion distribution electron element emission energy eV excited field film image imaging intensity keV layer lens magnetic material pattern point potential probe range recorded resolution scattering SEM signal specimen spectrometer structure surface thickness tilt voltage wave
Title: Scanning Electron Microscopy and X-ray Microanalysis
Authors: Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, L.C. Sawyer, J.R. Michael
Publisher: Plenum US; 3rd edition (February, 2003)
ISBN: 0306472929
From Book News: The basis of this textbook is a short course taught by the authors at the Lehigh Microscopy Summer School. Chapters cover electron beam-specimen interaction, image formation and interpretation, x-ray spectral measurement, x-ray analysis, specimen preparation, and procedures for elimination of charging in specimens. The CD-ROM contains more advanced discussion that is detailed and equation-rich, much of which formed the last chapter of the second edition.
Book Description (from Amazon): This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition techniques for the elimination of charging in non-conducting specimens are detailed. A data base of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD. This is the third edition of this highly acclaimed text and has been extensively revised. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities in every corner of the globe. The authors have made extensive changes to the text and figures in this edition as a result of their experience in teaching the various concepts of SEM and x-ray microanalysis.
Title: Scanning and Transmission Electron Microscopy: An Introduction
Authors: Stanley L. Flegler, John W. Heckman, Karen L. Klomparens
Publisher: Oxford University Press; Reprint edition (October 1, 1995)
ISBN: 0195107519
Book Description (from Amazon): This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity--and filled with helpful diagrams, photographs, and drawings--this text offers the best introduction to scanning and transmission electron microscopy available. Due to its comprehensive coverage, the book will serve as an ideal course text in the electron microscopy classes organized for the benefit of advanced students in both the biological and physical sciences.
Statistically Improbable Phrases (from Amazon): analytical spatial resolution, tungsten gun, specimen beam interaction, cryoadsorption pump, critical excitation energy, objective lens astigmatism, filament saturation, electron channeling, most electron microscopes, charging artifacts, ultrathin sectioning, final aperture, ultrarapid freezing, rough pumping, atomic number differences, intermediate lens, inelastically scattered electrons, secondary fixation, takeoff angle, backing pump, using backscattered electrons, objective lens aperture, freeze etch, carbon evaporation, condenser lens system
Most Common Terms (from Amazon): analysis angle aperture applications area backscattered beam chamber contrast crystal current depth detector distance electron elements energy field filament film gun image imaging interaction lens magnification material metal microscope microscopy molecules peak point preparation process pump rays resin resolution sample scanning secondary sections SEM source specimen surface temperature vacuum voltage
Title: Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
Authors: David H. Krinsley, Kenneth Pye, Sam Boggs, N. Keith Tovey
Publisher: Cambridge University Press (July 13, 1998)
ISBN: 0521453461
EOS Review: This book documents the positive impacts of two devices, the backscattered electron (BSE) analyzer and the digital image analyzer, on the quality of sedimentological research with the modern SEM... the book is well written. It was edited by four authors who are experienced in this aspect of sedimentary petrology and well regarded by their peers, and it contains many clear, high-quality reproductions of SEM microphotographs... I am certainly glad to have it on my shelf, because... it is a landmark in its field.
Geological Magazine Review: I felt that I had a lot from the examples presented in this book, and that they had provoked a number of new ideas. Throughout, I gained the impression that the intention was not to simply present a review of previous applications, but instead to show how many new things could be done... I think that the book will be useful source for ideas for academic and professional geologists, and geotechnical companies and researchers. Worth having.
Book Description (from Amazon): Backscattered scanning electron microscopy (BSE) reveals the minerals, textures, and fabrics of sediments and rocks in much greater detail than is possible with conventional optical microscopy. Backscattered Scanning Electron Microscopy provides a concise summary of the BSE technique. This comprehensive guide uses abundant images to illustrate the type of information BSE yields and the application of the technique to the study of sediments and sedimentary rocks. The authors review the use of this petrographic technique on all the major sedimentary rock types, including sediment grains, sandstones, shales, carbonate rocks, rock varnish, and glauconite. They also describe image analysis techniques that allow quantification of backscattered scanning electron microscope images. Heavily illustrated and lucidly written, this book will provide researchers and graduate students with the most current research on this important geological tool.
Statistically Improbable Phrases (from Amazon): partially albitized, glauconite peloids, zoned dolomite, glauconite grains, foraminifer test, multispectral methods, cement stratigraphy, petrographic microscopy, backscattered electron microscopy, authigenic illite, pyrite framboids, zoned crystal, atomic number contrast, granitoid gneiss, rock varnish, forced classification, different mineral phases, plagioclase grain, dolomite crystals, authigenic clay, planktonic foraminifer, magnesian calcite, carbonate grains, calcite cement, textural relationships
Most Common Terms (from Amazon): analysis applications areas atomic backscattered beam BSE calcite carbonate cement chemical clay contrast cracks crystals detector detrital dissolution dolomite electrons feldspars formation grains gray illite iron kaolinite layers matrix mica minerals orientation particles pixels pore porosity pyrite quartz rock sample sandstone scale sediments shales specimen surface techniques textures varnish weathering
Title: The Principles and Practice of Electron Microscopy
Author: Ian M. Watt
Publisher: Cambridge University Press; 2nd edition (January 30, 1997)
ISBN: 0521435919
Scanning Review: This book combines the practical aspects of electron microscopy with just enough theory to capture the interests at all levels. The generous use of examples and the wealth of topics covered make this an attractive textbook for an introductory course in electron microscopy...The discussion of related analytical methods such as SEAM, Spin SEM, and FIM is very welcome in a book of this type and the appendix is also detailed and informative. In short, a reader will find in this book useful information about instrumentation and technique in very readable form, which can be understood and put into practice with a minimum of additional effort.
The Leading Edge Review: ...a must read for any person interested in finding out about this broad discipline... a descriptive, visually oriented text, with many informative figures and stunning electron micrograph images.
Book Description (from Amazon): This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practicing electron microscopists. He describes currently hot topics such as computer control of microscopes, energy-filtered imaging, cryomicroscopy and environmental microscopy, digital imaging, high resolution scanning, and transmission microscopy. The author has expanded the highly praised case studies of the first edition to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years' practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.
Statistically Improbable Phrases (from Amazon): stereoscopic microscopy, goniometer specimen stage, emissive mode, third condenser lens, lens bore, eucentric goniometer, other microscopical, channelling patterns, stub surface, scanning electron probe, scan rotation, probe forming lens, derivative processing, electron illumination, scanned frame, transmission micrographs, final lens, electron spot, specimen tilt, final aperture, tilted specimen, specimen plane, energy spectrometer, objective diaphragm, lens column
Most Common Terms (from Amazon): area axis beam column crystal current detector diffraction electrons elements emission energy features field film focus focused image imaging instrument kV lens lines magnification materials micrographs microscope microscopy objective particles pattern plane point preparation probe range resolution results scanning secondary section signal specimen stage structure surface thin tilt vacuum voltage
Title: Quantitative Electron-Probe Microanalysis
Authors: V.D. Scott, G. Love, S.J.B. Reed
Publisher: Prentice Hall PTR; 2nd edition (January 23, 1995)
ISBN: 0131040502
From Book News: Covers practical and theoretical aspects of techniques in electron- probe microanalysis, looking at specimen preparation, instrumental procedures, and data collection and quantification, and outlining underlying physical principles and the latest developments in correction models. For postgraduate students, industrial and government researchers, and others involved in materials science, engineering, and analysis. This second edition reflects progress in the field since 1995, especially regarding ultra-light elements and correction methods used for quantifying experimental data.
Book Description (from Amazon): This volume provides a balanced treatment of both practical and theoretical aspects of the techniques of electron-probe microanalysis, and is particularly valuable for both the practical microanalyst interested in problems of specimen preparation, instrument procedures, data collection and quantification, and for the researcher interested in the underlying physical principles and the latest developments in correction models. This edition reports on the rapid progress that has been made in a number of areas of electron-probe microanalysis (EPMA), especially with regard to the ultra-light elements and in the correction methods used for quantifying experimental data. For industrial and government researchers, technologists and engineers involved with materials science and materials analysis, and those concerned with analysis techniques in areas such as biology, medicine, pharmacology, geology, and engineering.
Title: Energy Dispersive Spectrometry of Common Rock Forming Minerals
Author: Kenneth P. Severin
Publisher: Springer; 1st edition (May, 2005)
ISBN: 1402028407
Book Description (from Amazon): Ken Severin: "This book came about because of my poor memory: it is amazing how quickly and easily an experienced electron microscopist/mineralogist can identify minerals with an Energy Dispersive Spectrometer (EDS). It is also amazing how long it takes someone who is not good at mineralogy to search through a mineralogy text, trying to match the peaks on their unknown spectrum with the chemical formula of some mineral. After the mineral is finally identified, it is easy to identify other specimens of similar composition as EDS spectra have very distinctive patterns. For me, however, as I move between projects, it is easy to forget the patterns. After several episodes of having to relearn the spectra of some all too common rock forming minerals, I decided that a book of EDS 'flashcards' would be useful - a catalogue of the minerals that are commonly found in rocks. In addition, why not make a key? This would save a fair amount of time for those who are less experienced mineralogists, but, for whatever reason, use an Energy Dispersive Spectrometer to identify minerals."
