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Have Questions?
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Have questions about electron microprobe analysis? Want to know more about our facility? Send us an e-mail or visit our Contact Us page.
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JEOL 8900 "Super Probe" Electron Probe Microanalyzer
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Our JEOL JXA-8900 microprobe has the following specifications and capabilities:
- Computer automation; operation via graphical user interface (GUI).
- Five wavelength-dispersive spectrometers (WDS):
- Detectable element range: 4-Be to 92-U (all elements with Z > 3).
- Detectable wavelength range: 0.087 to 9.3 nanometers.
- Eight crystal types: TAP, PETJ, PETH, LDE1, LDE2, LDEB, LIF, and LIFH.
- Layered dispersive elements, gas-flow detectors allow light-element analyses.
- One energy-dispersive spectrometer (EDS):
- Solid-state Si(Li) detector, liquid-nitrogen cooled, Be detector window.
- Manufactured by Noran Corporation, now Thermo Electron Corporation.
- Secondary-electron (SE) and backscattered-electron (BSE) imaging:
- SE image resolution: 6 nanometers (at 35 kV accelerating voltage).
- BSE image modes: composition (sum) and topography (difference).
- Scanning image magnification: 40X to 300,000X (max theoretical).
- Multi-element line analyses (beam scan and X-Y stage scan modes).
- Multi-element area maps (beam scan and X-Y stage scan modes).
- Matrix corrections using ZAF, calibration curve, and thin film methods.
- Oxford Instruments "MiniCL" cathodoluminescence (CL) imaging system.
- Output: photographs, thermal prints, digital media, color laser printer, and WWW transfer.
- High-speed large specimen stage (HSLSS XM-81010):
- Maximum sample size: 100 x 100 x 50 mm (H).
- Maximum analyzable area: 90 x 90 mm.
- Optical encoders w/ 0.02 micron resolution.
- Stage reproducability: less than 0.5 microns.
- Drive speed: 15 mm/sec maximum.
- Accelerating voltage: 0.2 to 40 kV (0.2-10 kV: 0.1 kV steps; 10-40 kV: 0.5 steps).
- Electron probe current range: 1E-12 to 1E-5 Amps.
- Electron probe current stability: 0.001/hr with beam stabilier.
- Integrated visible-light microscopy: reflected light at 400X.
- Carnegie auto-focus system for optimal sample positioning.
JXA-8900 Description from the JEOL website:
The JXA-8900 SuperProbe is a high resolution SEM and a WD/ED Combined Electron Probe Microanalyzer (EPMA). The combination of up to 5 wavelength dispersive X-ray spectrometers (WDS) and an energy dispersive X-ray spectrometer (EDS) assures the most efficient and accurate analysis. Computer input analyzes data from the two types of X-ray spectrometers and presents the data as a unified analysis. The WD/ED combined system can simultaneously analyze up to 13 elements (5 WDS, 8 EDS). The backscattered electron image, provided by a highly sensitive solid state detector, and the secondary electron image, brings the total obtainable signals to 15. The WD/ED combined microanalyzer provides for:
- Higher detection sensitivity for trace elements.
- Higher accuracy of quantitative analysis.
- Higher resolving power (resolution) for adjacent X-rays.
- Higher accuracy of quantitative analysis for light elements.
General information about electron microprobe analysis can be found here.
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Laboratory Facilities & Equipment
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Sample Preparation:
The Electron Microprobe Laboratory is equipped with a JEOL JEE-400 Vacuum Evaporator that can be used to coat specimens with a thin carbon (or gold) layer prior to analysis. The Department of Geology & Geophysics also houses the "Rock Room," which includes diamond rock saws, polishing wheels with an automatic polisher, a coring drill, thin-section preparation equipment and supplies, and an ultrasonic cleaner.
Visible-Light Microscopy:
Ziess Axioplan petrographic microscope, outfitted for polarizing microscopy in both transmitted and reflected light; it is also equipped with video capture abilities in order to acquire digital images of a specimen.
Computer Resources:
Off-line UNIX microprobe workstation; Macintosh (relevant software includes Adobe Photoshop and Illustrator, NIH Image, Microsoft Office, FileMaker mineral and standard databases, and graphing applications); PC (relevant software includes Soft Imaging's analSYS, Small World's Electron Flight Simulator, Oxford Guide to Microanalysis, Adobe Photoshop, and Scion Image).
Associated Laboratories:
The Electron Microprobe Laboratory is closely associated with the department's X-ray Mineralogy Laboratory, which houses a Rigaku MiniFlex X-ray diffractometer. Our laboratory also has ties to another Institute of Technology lab, the Characterization Facility, which has instruments for X-ray scattering, proximal probe analysis, ion beam analysis, optical characterization, electron microscopy and spectroscopy, infrared spectroscopy, and neutral scattering. The Department of Geology & Geophysics also has a wide variety of analytical instruments, including various mass spectrometers, gas and ion chromotography, and various magnetometers.
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Content published on this Web Site is copyright the University of Minnesota Regents, the Electron Microprobe Laboratory, and/or the laboratory's users. Some content (particularly analyses and images of specimens) represents the intellectual property of laboratory users. Reproduction or distribution without permission is prohibited. Site content is available for educational and informational uses only, provided that the content is unmodified and that permission is granted by the author and/or the laboratory manager.
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